Surface error diagnosis of large reflector antenna with microwave holography based on active deformation
Liu, Kangkang; Ye, Qian; Meng, Guoxiang
2016-01-08
Source PublicationElectronics Letters
ISSN0013-5194
Volume52Issue:1Pages:12-13
AbstractMicrowave holographic techniques have been used widely in the radio astronomy area. A new surface diagnosis method based on the phase-retrieval holograph algorithm is proposed. This approach focuses on a novel application of the active deformation. Multiple far-field patterns are measured in focus by adjusting the deformation of the main reflector actively. Using the amplitude of far-field patterns, the phase distribution of the aperture can be retrieved by the phase-retrieval technique. Simulation results demonstrate the feasibility of this method.
Correspondent Emailyeqian@sjtu.edu.cn
KeywordEngineering
SubtypeArticle
DOI10.1049/el.2015.2725
Indexed BySCI
Language英语
WOS Research AreaEngineering
WOS SubjectEngineering, Electrical & Electronic
WOS IDWOS:000367750500005
Project Number2015CB857100
Funding OrganizationShanghai 65 m radio telescope project ; National Key Basic Research Program of China (973 Program)
Citation statistics
Cited Times:6[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.xao.ac.cn/handle/45760611-7/1571
Collection110米口径全可动射电望远镜(QTT)_110米大口径全可动射电望远镜关键技术研究(973项目)_课题4:反射面高精度快速测量与主动面实时闭环修正
Corresponding AuthorYe, Qian
AffiliationShanghai Jiao Tong Univ, 800 Dongchuan RD, Shanghai 200030, Peoples R China
Recommended Citation
GB/T 7714
Liu, Kangkang,Ye, Qian,Meng, Guoxiang. Surface error diagnosis of large reflector antenna with microwave holography based on active deformation[J]. Electronics Letters,2016,52(1):12-13.
APA Liu, Kangkang,Ye, Qian,&Meng, Guoxiang.(2016).Surface error diagnosis of large reflector antenna with microwave holography based on active deformation.Electronics Letters,52(1),12-13.
MLA Liu, Kangkang,et al."Surface error diagnosis of large reflector antenna with microwave holography based on active deformation".Electronics Letters 52.1(2016):12-13.
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